JPS5571024A - Mark sensing method - Google Patents

Mark sensing method

Info

Publication number
JPS5571024A
JPS5571024A JP14413578A JP14413578A JPS5571024A JP S5571024 A JPS5571024 A JP S5571024A JP 14413578 A JP14413578 A JP 14413578A JP 14413578 A JP14413578 A JP 14413578A JP S5571024 A JPS5571024 A JP S5571024A
Authority
JP
Japan
Prior art keywords
signal
chopped
sampling pulses
band
mark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14413578A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5653850B2 (en]
Inventor
Nobuo Hamamoto
Kazuo Ichino
Tsuneo Okubo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Hitachi Ltd
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Nippon Telegraph and Telephone Corp filed Critical Hitachi Ltd
Priority to JP14413578A priority Critical patent/JPS5571024A/ja
Priority to US06/097,125 priority patent/US4286154A/en
Publication of JPS5571024A publication Critical patent/JPS5571024A/ja
Publication of JPS5653850B2 publication Critical patent/JPS5653850B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H01J37/3045—Object or beam position registration

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP14413578A 1978-11-24 1978-11-24 Mark sensing method Granted JPS5571024A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP14413578A JPS5571024A (en) 1978-11-24 1978-11-24 Mark sensing method
US06/097,125 US4286154A (en) 1978-11-24 1979-11-26 Method of detecting a mark by an electron beam and an apparatus therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14413578A JPS5571024A (en) 1978-11-24 1978-11-24 Mark sensing method

Publications (2)

Publication Number Publication Date
JPS5571024A true JPS5571024A (en) 1980-05-28
JPS5653850B2 JPS5653850B2 (en]) 1981-12-22

Family

ID=15355024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14413578A Granted JPS5571024A (en) 1978-11-24 1978-11-24 Mark sensing method

Country Status (2)

Country Link
US (1) US4286154A (en])
JP (1) JPS5571024A (en])

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4365163A (en) * 1980-12-19 1982-12-21 International Business Machines Corporation Pattern inspection tool - method and apparatus
DE3482769D1 (de) * 1984-05-30 1990-08-23 Siemens Ag Verfahren und vorrichtung zur detektion und abbildung eines messpunkts, der eine spannung wenigstens einer bestimmten frequenz fuehrt.
EP0201692A1 (de) * 1985-03-22 1986-11-20 Siemens Aktiengesellschaft Verfahren zur Auswertung einer Messspannung mittels einer bandbreitenbegrenzten Auswerteschaltung und Anordnung zur Durchführung des Verfahrens
EP0226913A3 (de) * 1985-12-17 1988-10-05 Siemens Aktiengesellschaft Verfahren und Anordnung zur Lokalisierung und/oder Abbildung der ein bestimmtes zeitabhängiges Signal führenden Punkte einer Probe
JP2585223B2 (ja) * 1986-06-18 1997-02-26 株式会社日立製作所 電子ビ−ム露光装置におけるマ−ク位置検出装置
JPH01102930A (ja) * 1987-10-16 1989-04-20 Hitachi Ltd 電子線描画装置
US4845362A (en) * 1988-02-02 1989-07-04 North American Philips Corporation In situ differential imaging and method utilizing a scanning electron microscope
JPH02112051U (en]) * 1989-02-23 1990-09-07
US4977328A (en) * 1989-03-02 1990-12-11 U.S. Philips Corporation Method of detecting a marker provided on a specimen
JP2943815B2 (ja) * 1990-04-06 1999-08-30 日本電子株式会社 電子ビーム測長機における測長方式

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3535516A (en) * 1966-10-17 1970-10-20 Hitachi Ltd Electron microscope employing a modulated scanning beam and a phase sensitive detector to improve the signal to noise ratio
US4063091A (en) * 1976-10-18 1977-12-13 American Optical Corporation High speed switching circuit

Also Published As

Publication number Publication date
JPS5653850B2 (en]) 1981-12-22
US4286154A (en) 1981-08-25

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